Product | Brand | Description | Batch no | For quotation |
---|---|---|---|---|
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SN74LVTH182646APM | Scan Test Device
|
Consultation | |
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SN74LVT8986PM | Transceiver -40°C to 85°C 64-Pin LQFP Tray
|
1948 |
Consultation |
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SN74ABTH182502APM | Scan Test Device -40°C to 85°C 64-Pin LQFP Tray
|
Consultation | |
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SN74ABT18504PM | Scan Test Device -40°C to 85°C 64-Pin LQFP Tray
|
1727 |
Consultation |
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SN74ABT18245ADL | Scan Test Device -40°C to 85°C 56-Pin SSOP Tube
|
1406 |
Consultation |
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DS1124U-25+T | Programmable Timing Element -40°C to 85°C 10-Pin uMAX T/R
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Consultation | |
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HV7358-V/AFA | Pulse Generator 0°C to 85°C 168-Pin TFBGA Tray
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Consultation | |
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SNJ54BCT8240AFK | Scan Test Device
|
Consultation | |
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SN74LVTH18652APM | Scan Test Device
|
Consultation | |
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SN74ACT1073NSR | Bus Termination Array -40°C to 85°C 20-Pin SOP T/R
|
Consultation | |
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SN74ABTH182504APM | Scan Test Device
|
Consultation | |
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8V182512IDGGREP | Scan Test Device
|
Consultation | |
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TMDS181RGZT | Retimer 0°C to 85°C 48-Pin VQFN EP T/R
|
Consultation | |
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SN74LVTH18646APM | Scan Test Device -40°C to 85°C 64-Pin LQFP Tray
|
Consultation | |
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SN74LVT18512DGGR | Scan Test Device
|
1848 |
Consultation |
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SN74ABT8652DL | Scan Test Device
|
Consultation | |
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SN74ABT18245ADLR | Scan Test Device
|
Consultation | |
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PCA9641PWJ | Demultiplexer -40°C to 85°C 16-Pin TSSOP T/R
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2052 |
Consultation |
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PCA9560PW,118 | Dual 5-bit multiplexed 1-bit latched I 2C EEPROM DIP switch -40°C to 85°C 20-Pin TSSOP T/R
|
Consultation | |
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LM567CM/NOPB | Tone Decoder 0°C to 70°C 8-Pin SOIC Tube
|
Consultation |