| Product | Brand | Description | Batch no | For quotation |
|---|---|---|---|---|
 |
SN74LVTH182646APM | Scan Test Device
|
Consultation | |
 |
SN74ABT18504PM | Scan Test Device -40°C to 85°C 64-Pin LQFP Tray
|
1727 |
Consultation |
|
SN74ABT18245ADL | Scan Test Device -40°C to 85°C 56-Pin SSOP Tube
|
1406 |
Consultation |
 |
HV7358-V/AFA | Pulse Generator 0°C to 85°C 168-Pin TFBGA Tray
 HV7358-V%2FAFA
|
Consultation | |
|
ZL30162GDG2 | Clock Translator -40°C to 85°C 144-Pin LBGA Tray
|
Consultation | |
|
ZL30155GGG2 | Universal Clock Translator -40°C to 85°C 100-Pin CABGA Tray
|
Consultation | |
|
ZL30116GGG2V2 | System Synchronizer -40°C to 85°C 100-Pin CABGA Tray
|
Consultation | |
|
SNJ54BCT8240AFK | Scan Test Device
|
Consultation | |
|
SN74LVTH18652APM | Scan Test Device
|
Consultation | |
|
SN74ACT1073NSR | Bus Termination Array -40°C to 85°C 20-Pin SOP T/R
|
Consultation | |
|
SN74ABTH182504APM | Scan Test Device
|
Consultation | |
|
8V182512IDGGREP | Scan Test Device
|
Consultation | |
 |
TMDS181RGZT | Retimer 0°C to 85°C 48-Pin VQFN EP T/R
|
Consultation | |
|
SN74LVTH18646APM | Scan Test Device -40°C to 85°C 64-Pin LQFP Tray
|
Consultation | |
 |
SN74LVT18512DGGR | Scan Test Device
|
1848 |
Consultation |
|
SN74ABT8652DL | Scan Test Device
|
Consultation | |
|
SN74ABT18245ADLR | Scan Test Device
|
Consultation | |
 |
PCA9641PWJ | Demultiplexer -40°C to 85°C 16-Pin TSSOP T/R
PCA9641PWJ
|
2052 |
Consultation |
|
PCA9560PW,118 | Dual 5-bit multiplexed 1-bit latched I 2C EEPROM DIP switch -40°C to 85°C 20-Pin TSSOP T/R
|
Consultation | |
 |
LM567CM/NOPB | Tone Decoder 0°C to 70°C 8-Pin SOIC Tube
|
Consultation |
|
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Please include any specific details such as part number(s) or order number. |
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